• Microspectrometers to measure UV-Vis-NIR spectrum of Microscopic Samples in Transmittance, Reflectance, Fluorescence Modes
• Thickness of multiplayer thin films
McPherson Inc.
• Spectrometers
• Reflectometers
Gamry Instruments.
Gamry offer high performance Potentiostat/Galvanostats with VFP600 Pulse Plating software for electrochemical deposition of thin films.
Cecil Instruments Applications
Automatic Thin Film Measurement
The measurement of thin deposited films
is important in many optical and electronic
industries.
The CE3075 Specular Reflectance unit is
valuable for measuring the thickness of
thin transmitting films such as epitaxial
films of silicon oxide on a silicone wafer. A reflectance scan against wavelength
produces a series of reflectance maxima
and minima, due to optical interference,
from which the ReflectaScanTM instrument
automatically calculates the film thickness
for films down to 0.1 microns thick.
Coated Lens reflectance
Thickness of Thin Films
Automatic Colour Computation of Paints with Colour ScanTM Software
• Microspectrometers to measure UV-Vis-NIR spectrum of Microscopic Samples in Transmittance, 
• Spectrometers
Gamry offer high performance Potentiostat/Galvanostats with VFP600 Pulse Plating software for electrochemical deposition of thin films.
